SNIA Developer Conference September 15-17, 2025 | Santa Clara, CA

Name
Yongjin Choi
First Name
Yongjin
Last Name
Choi
Old Speaker ID
557
Is 2024 Speaker
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Storage Device Quality Control and Supply Chain Management Using Dual Machine Learning Models

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It is well known that storage sensor data on storage systems can detect abnormal symptoms that can lead to failures. With the abnormal sensor data and machine learning techniques, we can predict a storage component failure ahead of time and proactively remove it, before it can impact the remaining system or interrupt customer’s operations. A successful predictive maintenance model must make trade off in detection rate, false positive and lead time.

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