Thomas Boone

Thomas Boone, Ph.D. is a Distinguished Engineer at Western Digital where he manages defense and aerospace research program. He leads the company’s performance of the United States Air Force Research Lab ANGSTRM program to develop the next-generation strategically rad-hard memory for the DoD. With over 20 years experience in R&D management and technical leadership within the microelectronics and data storage industries, he specifically focuses on HiRel rad-hard microelectronic solutions for defense and aerospace applications. Dr. Boone received his Ph.D. in AP/EE from Yale University in 2004, MSEE from Purdue University in 1998 and BSEE from U.T. Arlington in 1994. He has over 20 issued U.S. patents and co-author of 26 peer-reviewed journal articles.