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SNIA Developer Conference September 15-17, 2025 | Santa Clara, CA

Sathish Kumar M

Associate Technical Director,

Samsung Semiconductor India Research

Sathish Kumar is a seasoned Storage Test Architect with over 19+ years of rich industry experience in enterprise storage, server platforms, and system testing. Currently serving as an Associate Technical Director at Samsung Semiconductor India Research, he leads the Solutions System Test team, delivering end-to-end qualification of NVMe over Fabrics solutions and contributing to Open Compute Project (OCP) forums. Throughout his career, Sathish has built deep technical expertise across companies like Dell EMC, Brocade, and Adaptec. He has architected scalable test strategies, developed automation frameworks, led cross-functional teams, and mentored engineers to achieve business and technical goals. His hands-on proficiency in Python, storage protocols (FCP, SAS, SCSI), virtualization technologies, and RESTful APIs underscores his versatile skill set. A recognized innovator, Sathish holds a U.S. patent on intelligent test automation using reverse-engineered REST API specifications. He has also been an active contributor to global tech forums, presenting at OCP Summit & Future of Memory and Storage in the U.S.

Rethinking Storage for the AI/ML Era: Disaggregation Powered with FDP

Submitted by Anonymous (not verified) on
Generative AI models, such as Stable Diffusion, have revolutionized the field of AI by enabling the generation of images from textual prompts. These models impose significant computational, and storage demands in HPC environments. The I/O workload generated during image generation is a critical factor affecting overall performance and scalability. This paper presents a detailed analysis of the I/O workload generated by Stable Diffusion when accessing storage devices, specifically NVMe-oF drives.
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