Abstract
V1.0 of the Solid State Storage Performance Test Specification for Enterprise (PTS-E) has been released to the public and is slowly gaining recognition. PTS-E V1.0 presents uniform methodology for SSS testing, and covers basic device characteristic such as IOPS, Throughput and Latency. Additional tests intended for V1.1 are of interest to the Enterprise environment is now being introduced that includes a more in-depth look at how drives perform in specific access environments, with added emphasis on mixed workloads and response time characteristics of the device
Learning Objectives
To explain the motivation and need for the new tests in PTS-E V1.1.
To describe the mechanics of these tests in detail, and to provide illustrative results.
At the end of this tutorial, listeners should gain sufficient knowledge to implement and interpret the results from these new tests